Three contributions were made at the 5th Radiation Semiconductor Detector Workshop at Xi’an:

• 4H-碳化硅PIN辐照后电学性能退化机制研究 by Zaiyi Li
• 基于4H-SiC的CEPC快速亮度探测器的设计与仿真 by Yanpeng Li
• 基于RASER的碳化硅探测器性能与应用研究 by Suyu Xiao